Advances in Computational Methods for X-Ray Optics III

Advances in Computational Methods for X-Ray Optics V

X-Ray Nanoimaging: Instruments and Methods III

Advances in X-Ray/EUV Optics and Components III

Advances in Metrology for X-Ray and EUV Optics III

Advances in X-Ray Optics

Adaptive X-Ray Optics III

Advances in Laboratory-Based X-Ray Sources and Optics III

Optics for EUV, X-Ray, and Gamma-Ray Astronomy III

X-Ray Optics, Instruments, and Missions III

Advances in X-Ray/EUV Optics and Components X

Advances in Metrology for X-Ray and EUV Optics X

X-Ray Nanoimaging: Instruments and Methods

Advances in Metrology for X-Ray and EUV Optics

Multilayer Optics for Advanced X-Ray Applications

Damage to VUV, EUV, and X-ray Optics III

Fourth Generation X-Ray Sources and Optics III

Developments in X-Ray Tomography III

Advances in X-ray Free-Electron Lasers Instrumentation III

Optics for EUV, X-Ray, and Gamma-Ray Astronomy X

EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III

Hard X-Ray and Gamma-Ray Detector Physics III

X-Ray Nanoimaging: Instruments and Methods II

X-Ray Nanoimaging: Instruments and Methods VI

X-Ray Nanoimaging: Instruments and Methods V

X-Ray Nanoimaging: Instruments and Methods IV

Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation

X-Ray Sources and Optics

Soft X-Ray Optics
Tekijä: Spiller, Eberhard Adolf

Adaptive X-Ray Optics

Advances in X-Ray/EUV Optics and Components XVII

Advances in X-Ray/EUV Optics and Components XVIII

Advances in Metrology for X-Ray and EUV Optics V

Advances in X-Ray/EUV Optics and Components IX

Advances in X-Ray/EUV Optics and Components XVI

Advances in X-Ray/EUV Optics and Components XIV

Advances in Metrology for X-Ray and EUV Optics VIII