Han, S. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.
Style de citation Chicago (17e éd.)Han, Sen. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.
Style de citation MLA (9e éd.)Han, Sen. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.
Attention : ces citations peuvent ne pas être correctes à 100%.