Cita APA

Han, S. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.

Citación estilo Chicago

Han, Sen. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.

Cita MLA

Han, Sen. Optical Metrology and Inspection for Industrial Applications III. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.