APA (7e ed.) Bronvermelding

Cain, J. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

MLA (9e ed.) Bronvermelding

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.