APA (7. basım) Alıntı

Cain, J. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

MLA (9th ed.) Atıf

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXIX. SPIE Digital Library.

Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..