Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
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| Formato: | Electrónico eBook |
| Lenguaje: | inglés |
| Publicado: |
SPIE Digital Library,
3/19/20
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| Materias: | |
| Acceso en línea: | Full text available on Research4Life (SPIE Digital Library) |
| Notas: | <strong>On-Campus Access Only (IP based access)</strong> |
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| Descripción Física: | 1 online resource |
| Formato: | Mode of access: Internet |
| ISBN: | 9781510633551 9781510633568 |
| Acceso: | Electronic access restricted to authorized AUW faculty, staff and students |