Adan, O. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
Chicago Style (17th ed.) CitationAdan, Ofer. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
MLA (9th ed.) CitationAdan, Ofer. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.