Adan, O. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
Citación estilo ChicagoAdan, Ofer. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
Cita MLAAdan, Ofer. Metrology, Inspection, and Process Control for Microlithography XXXIV. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.