APA (7. basım) Alıntı

Adan, O. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Adan, Ofer. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

MLA (9th ed.) Atıf

Adan, Ofer. Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. SPIE Digital Library.

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