Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
| Glavni autor: | |
|---|---|
| Format: | Elektronički e-knjiga |
| Jezik: | engleski |
| Izdano: |
SPIE Digital Library,
1/1/19
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| Teme: | |
| Online pristup: | Full text available on Research4Life (SPIE Digital Library) |