Automated Visual Inspection and Machine Vision III

Détails bibliographiques
Autres auteurs: Beyerer, Jürgen
Format: Électronique eBook
Langue:anglais
Publié: SPIE Digital Library, 10/4/19
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9781510628014
9781510628021
Accès:Electronic access restricted to authorized AUW faculty, staff and students