Automated Visual Inspection and Machine Vision III

Sonraí bibleagrafaíochta
Rannpháirtithe: Beyerer, Jürgen
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: SPIE Digital Library, 10/4/19
Ábhair:
Rochtain ar líne:Full text available on Research4Life (SPIE Digital Library)
Cur síos
Cur síos ar an mír:<strong>On-Campus Access Only (IP based access)</strong>
Cur síos fisiciúil:1 online resource
Formáid:Mode of access: Internet
ISBN:9781510628014
9781510628021
Rochtain:Electronic access restricted to authorized AUW faculty, staff and students