Optical Technology and Measurement for Industrial Applications Conference

Détails bibliographiques
Autres auteurs: Hatsuzawa, Takeshi
Format: Électronique eBook
Langue:anglais
Publié: SPIE Digital Library, 4/21/19
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9781510629776
9781510629783
Accès:Electronic access restricted to authorized AUW faculty, staff and students