Sanchez, M. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
Citación estilo ChicagoSanchez, Martha. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
Cita MLASanchez, Martha. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.