Sanchez, M. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
Chicago Style (17th ed.) CitationSanchez, Martha. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
MLA citiranjeSanchez, Martha. Metrology, Inspection, and Process Control for Microlithography XXXI. SPIE Digital Library.
Opozorilo: Ti citati niso vedno 100% točni.