Aspnes, D. Optical Characterization Techniques for Semiconductor Technology. SPIE Digital Library.
Chicago Style (17th ed.) CitationAspnes, David. Optical Characterization Techniques for Semiconductor Technology. SPIE Digital Library.
MLA citiranjeAspnes, David. Optical Characterization Techniques for Semiconductor Technology. SPIE Digital Library.
Opozorilo: Ti citati niso vedno 100% točni.