Pollak, F. Spectroscopic Characterization Techniques for Semiconductor Technology II. SPIE Digital Library.
Dyfyniad Arddull ChicagoPollak, Fred. Spectroscopic Characterization Techniques for Semiconductor Technology II. SPIE Digital Library.
Dyfyniad MLAPollak, Fred. Spectroscopic Characterization Techniques for Semiconductor Technology II. SPIE Digital Library.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.