Surface Characterization and Testing
| Beste egile batzuk: | |
|---|---|
| Formatua: | Baliabide elektronikoa eBook |
| Hizkuntza: | ingelesa |
| Argitaratua: |
SPIE Digital Library,
3/23/87
|
| Gaiak: | |
| Sarrera elektronikoa: | Full text available on Research4Life (SPIE Digital Library) |
Antzeko izenburuak
Interferometry: Surface Characterization and Testing
Surface Characterization and Testing II
Surface Measurement and Characterization
Reliability, Testing, and Characterization of MEMS/MOEMS
Design and Characterization of Transmissive and Reflective Components for Surface Plasmon Polaritons
nork: Coello, Victor
nork: Coello, Victor
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
Reliability, Testing, and Characterization of MEMS/MOEMS III
Reliability, Testing, and Characterization of MEMS/MOEMS II
Surfacing.
nork: Atwood, Margaret
Argitaratua: (1972)
nork: Atwood, Margaret
Argitaratua: (1972)
Surfacing.
nork: Atwood, Margaret
Argitaratua: (1972)
nork: Atwood, Margaret
Argitaratua: (1972)
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Surface and Destroy
nork: Sturma
nork: Sturma
Writing Surfaces
nork: derekbeaulieu
nork: derekbeaulieu
Below the Surface
Available Surfaces
nork: Hummer
nork: Hummer
Surface Engineering
The Cell Surface
Ocular Surface, The
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
Surface Engineering and Forensics
Optical Surface Technology
Precision Surface Metrology