Surface Characterization and Testing
| Ētahi atu kaituhi: | Creath, Kathy |
|---|---|
| Hōputu: | Tāhiko īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
SPIE Digital Library,
3/23/87
|
| Ngā marau: | |
| Urunga tuihono: | Full text available on Research4Life (SPIE Digital Library) |
Ngā tūemi rite
Interferometry: Surface Characterization and Testing
Surface Characterization and Testing II
Surface Measurement and Characterization
Reliability, Testing, and Characterization of MEMS/MOEMS
Design and Characterization of Transmissive and Reflective Components for Surface Plasmon Polaritons
mā: Coello, Victor
mā: Coello, Victor
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
Reliability, Testing, and Characterization of MEMS/MOEMS III
Reliability, Testing, and Characterization of MEMS/MOEMS II
Surfacing.
mā: Atwood, Margaret
I whakaputaina: (1972)
mā: Atwood, Margaret
I whakaputaina: (1972)
Surfacing.
mā: Atwood, Margaret
I whakaputaina: (1972)
mā: Atwood, Margaret
I whakaputaina: (1972)
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Surface and Destroy
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mā: Sturma
Writing Surfaces
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Below the Surface
Available Surfaces
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Surface Engineering
The Cell Surface
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
Surface Engineering and Forensics
Optical Surface Technology
Precision Surface Metrology
Ngā tūemi rite
- Interferometry: Surface Characterization and Testing
- Surface Characterization and Testing II
- Surface Measurement and Characterization
- Reliability, Testing, and Characterization of MEMS/MOEMS
-
Design and Characterization of Transmissive and Reflective Components for Surface Plasmon Polaritons
mā: Coello, Victor