Monahan, K. Integrated Circuit Metrology, Inspection, & Process Control. SPIE Digital Library.
Chicago Style (17th ed.) CitationMonahan, Kevin. Integrated Circuit Metrology, Inspection, & Process Control. SPIE Digital Library.
MLA引文Monahan, Kevin. Integrated Circuit Metrology, Inspection, & Process Control. SPIE Digital Library.
警告:這些引文格式不一定是100%准確.