Glembocki, O. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Citación estilo ChicagoGlembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Cita MLAGlembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.