Glembocki, O. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Citação norma ChicagoGlembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Citação norma MLAGlembocki, Orest. Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices. SPIE Digital Library.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.