Photomechanics and Speckle Metrology
| Άλλοι συγγραφείς: | Chiang, Fu-Pen |
|---|---|
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | Αγγλικά |
| Έκδοση: |
SPIE Digital Library,
2/17/87
|
| Θέματα: | |
| Διαθέσιμο Online: | Full text available on Research4Life (SPIE Digital Library) |
Παρόμοια τεκμήρια
Second International Conference on Photomechanics and Speckle Metrology
Speckle Metrology 2003
Speckle 2012: V International Conference on Speckle Metrology
SPECKLE 2015: VI International Conference on Speckle Metrology
Speckle 2018: VII International Conference on Speckle Metrology
Speckle 2010: Optical Metrology
Photomechanics '95
Interferometry '94: Photomechanics
Robust Speckle Metrology Techniques for Stress Analysis and NDT
από: Viotti, Matias R.
από: Viotti, Matias R.
Speckle06: Speckles, From Grains to Flowers
Simulating Speckle with Mathematica
από: Goodman, Joseph W.
από: Goodman, Joseph W.
Simulating Speckle with Python
από: Goodman, Joseph W.
από: Goodman, Joseph W.
Handbook of Speckle Interferometry
από: Davila, Abundio
από: Davila, Abundio
Applications of Speckle Phenomena
Intl Conf on Speckle
Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids
Laser-Tissue Interaction XI: Photochemical, Photothermal, and Photomechanical
Laser-Tissue Interaction XII: Photochemical, Photothermal, and Photomechanical
Laser Tissue Interaction XIII: Photochemical, Photothermal, and Photomechanical
Laser-Tissue Interaction X: Photochemical, Photothermal, and Photomechanical
Industrial Applications of Holographic and Speckle Measuring Techniques
Speckle Phenomena in Optics: Theory and Applications, Second Edition
από: Goodman, Joseph W.
από: Goodman, Joseph W.
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
Optoelectronic Metrology
Interferometric Metrology
Laser Metrology and Inspection
Microsystems Metrology and Inspection
Time and Frequency Metrology
Quantum Electronics Metrology
Industrial Vision Metrology
Microlithography and Metrology in Micromachining
Precision Surface Metrology