Advances in Metrology for X-Ray and EUV Optics VI

Manylion Llyfryddiaeth
Awduron Eraill: Assoufid, Lahsen
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: SPIE Digital Library, 1/1/16
Pynciau:
Mynediad Ar-lein:Full text available on Research4Life (SPIE Digital Library)
Disgrifiad
Disgrifiad o'r Eitem:<strong>On-Campus Access Only (IP based access)</strong>
Disgrifiad Corfforoll:1 online resource
Fformat:Mode of access: Internet
ISBN:9781510603158
9781510603165
Mynediad:Electronic access restricted to authorized AUW faculty, staff and students