Cita APA

Han, S. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

Citación estilo Chicago

Han, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

Cita MLA

Han, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.