APA引文

Han, S. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Han, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

MLA引文

Han, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.