APA citiranje

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

MLA citiranje

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Opozorilo: Ti citati niso vedno 100% točni.