Cita APA (7a ed.)

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Cita Chicago Style (17a ed.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Cita MLA (9a ed.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

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