Cita APA

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Citación estilo Chicago

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Cita MLA

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.