APA(7版)引用形式

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

Chicagoスタイル(17版)引用形式

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

MLA(9版)引用形式

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII. SPIE Digital Library.

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