APA ציטוט

Cain, J. Metrology, Inspection, and Process Control for Microlithography XXVIII. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXVIII. SPIE Digital Library.

ציטוט MLA

Cain, Jason. Metrology, Inspection, and Process Control for Microlithography XXVIII. SPIE Digital Library.

אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.