Postek, M. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Цитирование в стиле Чикаго (17-е изд.)Postek, Michael. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Цитирование MLA (9-е изд.)Postek, Michael. Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
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