Dyfyniad APA

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.

Dyfyniad Arddull Chicago

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.

Dyfyniad MLA

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.

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