Cita APA (7a ed.)

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.

Cita Chicago Style (17a ed.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.

Cita MLA (9a ed.)

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI. SPIE Digital Library.