Ramesham, R. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Chicago Style (17th ed.) CitationRamesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
MLA (9th ed.) CitationRamesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.