Ramesham, R. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Style de citation Chicago (17e éd.)Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Style de citation MLA (9e éd.)Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
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