Cita APA

Ramesham, R. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

Citación estilo Chicago

Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

Cita MLA

Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.