Ramesham, R. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Citatione MLA (9a ed.)Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.