APA (7. basım) Alıntı

Ramesham, R. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

MLA (9th ed.) Atıf

Ramesham, Rajeshuni. Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII. SPIE Digital Library.

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