Obálka

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

Podrobná bibliografie
Další autoři:	Ramesham, Rajeshuni
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	SPIE Digital Library, 3/26/13
Témata:	Conference papers and proceedings.
On-line přístup:	Full text available on Research4Life (SPIE Digital Library)

Podobné jednotky

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