Значок книги

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

Библиографические подробности
Другие авторы:	Ramesham, Rajeshuni
Формат:	Электронный ресурс eКнига
Язык:	английский
Опубликовано:	SPIE Digital Library, 3/26/13
Предметы:	Conference papers and proceedings.
Online-ссылка:	Full text available on Research4Life (SPIE Digital Library)

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