Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

Bibliográfalaš dieđut
Eará dahkkit: Ramesham, Rajeshuni
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: SPIE Digital Library, 3/26/13
Fáttát:
Liŋkkat:Full text available on Research4Life (SPIE Digital Library)

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