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Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

Бібліографічні деталі
Інші автори:	Ramesham, Rajeshuni
Формат:	Електронний ресурс eКнига
Мова:	Англійська
Опубліковано:	SPIE Digital Library, 3/26/13
Предмети:	Conference papers and proceedings.
Онлайн доступ:	Full text available on Research4Life (SPIE Digital Library)

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