Starikov, A. Metrology, Inspection, and Process Control for Microlithography XXVII. SPIE Digital Library.
Chicago (17e ed.) BronvermeldingStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVII. SPIE Digital Library.
MLA (9e ed.) BronvermeldingStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVII. SPIE Digital Library.
Let op: Deze citaties zijn niet altijd 100% accuraat.