Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
Chicago (17e ed.) BronvermeldingPostek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
MLA (9e ed.) BronvermeldingPostek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
Let op: Deze citaties zijn niet altijd 100% accuraat.