Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
Chicago-čujuhus (17. p.)Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
MLA-čujuhus (9. p.)Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing IV. SPIE Digital Library.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.