APA (7e ed.) Bronvermelding

Raymond, C. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.

MLA (9e ed.) Bronvermelding

Raymond, Christopher. Metrology, Inspection, and Process Control for Microlithography XXV. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.