Postek, M. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Παραπομπή σε μορφή Chicago (17η εκδ.)Postek, Michael. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
Παραπομπή σε μορφή MLA (9th εκδ.)Postek, Michael. Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. SPIE Digital Library.
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