Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Bibliographic Details
Other Authors: Postek, Michael
Format: Electronic eBook
Language:English
Published: SPIE Digital Library, 6/9/11
Subjects:
Online Access:Full text available on Research4Life (SPIE Digital Library)
Description
Item Description:<strong>On-Campus Access Only (IP based access)</strong>
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9780819486103
Access:Electronic access restricted to authorized AUW faculty, staff and students