Cita APA (7th ed.)

García-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Cita Chicago (17th ed.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Cita MLA (9th ed.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Atenció: Aquestes cites poden no estar 100% correctes.